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SFS-EN IEC 61788-24:2018:en
Superconductivity - Part 24: Critical current measurement - Retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires
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IEC 61788-24:2018 describes a test method for determining the retained critical current after double bending at room temperature of short and straight Ag- and/or Ag alloy-sheathed Bi-2223 superconducting wires that have the shape of a flat or square tape containing mono- or multicores of oxides. The wires can be laminated with copper alloy, stainless steel or Ni alloy tapes.
The test method is intended for use with superconductors that have a critical current less than 300 A and an n-value larger than 5.
Tämän julkaisun valmistelusta Suomessa vastaa SESKO ry, puh. 050 571 6048.
IEC 61788-24:2018 describes a test method for determining the retained critical current after double bending at room temperature of short and straight Ag- and/or Ag alloy-sheathed Bi-2223 superconducting wires that have the shape of a flat or square tape containing mono- or multicores of oxides. The wires can be laminated with copper alloy, stainless steel or Ni alloy tapes.
The test method is intended for use with superconductors that have a critical current less than 300 A and an n-value larger than 5.
Tämän julkaisun valmistelusta Suomessa vastaa SESKO ry, puh. 050 571 6048.
Tuoteryhmä(t)
Sidokset
Velvoittavat viittaukset
IEC 60050-815:2015 International Electrotechnical Vocabulary (IEV) - Part 815: Superconductivity
Tekninen komitea
Vahvistuspäivä
07.09.2018
Julkaisupäivä
11.09.2018
Painos
1
Sivumäärä
33
Julkaisun kieli
englanti