Lyhenteet

- A / A +

Takaisin

IEC TS 62804-2:2022 ed1.0 (2022-03)

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 2: Thin-film

Tuote ladattavissa heti Toimitusaika on noin 1 - 2 työpäivää Toimitusaika on noin 3 - 5 työpäivää
Soveltamisala
IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID.
This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.
Sidokset
Velvoittavat viittaukset
IEC TS 60904–13 Photovoltaic devices – Part 13: Electroluminescence of photovoltaic modules
IEC TS 61836 Solar photovoltaic energy systems – Terms, definitions and symbols
IEC TS 62804–1:2015 Photovoltaic (PV) modules – Test methods for the detection of potential-induced degradation – Part 1: Crystalline silicon
Vahvistuspäivä
29.03.2022
Julkaisupäivä
29.03.2022
Painos
1.0
Sivumäärä
44
Julkaisun kieli
englanti

Takaisin