Describes measurement procedures for current-voltage characteristics of crystalline silicon photovoltaic devices in natural or simulated sunlight. These procedures are applicable to a single solar cell, a sub-assembly of solar cells, or a flat module.
Tämän julkaisun valmistelusta Suomessa vastaa SESKO ry, puh. 050 571 6048.
EN 60891:1994 Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices
EN 60904-10:1998 Photovoltaic devices - Part 10: Methods of linearity measurement
EN 60904-2:1993 Photovoltaic devices - Part 2: Requirements for reference solar cells
EN 60891:1994 Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices
EN 60904-10:1998 Photovoltaic devices - Part 10: Methods of linearity measurement
EN 60904-2:1993 Photovoltaic devices - Part 2: Requirements for reference solar cells
EN 60904-3:1993 Photovoltaic devices - Part 3: Measurement principles for terrestrial photovoltaic (PV) solar devices with reference spectral irradiance data
EN 60904-5:1995 Photovoltaic devices - Part 5: Determination of the equivalent cell temperature (ECT) of photovoltaic (PV) devices by the open-circuit voltage method
EN 60904-6:1994 Photovoltaic devices - Part 6: Requirements for reference solar modules
EN 60904-7:1998 Photovoltaic devices - Part 7: Computation of spectral mismatch error introduced in the testing of a photovoltaic device
EN ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories (ISO/IEC 17025:2005)
IEC 60904-9:1995