IEC 60904-7:2008 describes the procedure for correcting the bias error introduced in the testing of a photovoltaic device, caused by the mismatch between the test spectrum and the reference spectrum and by the mismatch between the spectral responses (SR) of the reference cell and of the test specimen. The procedure applies only to photovoltaic devices linear in SR as defined in IEC 60904-10. This procedure is valid for single junction devices but the principle may be extended to cover multijunction devices. This new edition includes the following changes with respect to the previous one: description of when it is necessary to use the method and when it may not be needed; addition of new clauses.
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EN 60891:1994 Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices
EN 60904-10:1998 Photovoltaic devices - Part 10: Methods of linearity measurement
EN 60904-1:2006 Photovoltaic devices - Part 1: Measurement of photovoltaic current-voltage characteristics
EN 60891:1994 Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices
EN 60904-10:1998 Photovoltaic devices - Part 10: Methods of linearity measurement
EN 60904-1:2006 Photovoltaic devices - Part 1: Measurement of photovoltaic current-voltage characteristics
EN 60904-2:2007 Photovoltaic devices - Part 2: Requirements for reference solar devices
EN 60904-3:2008 Photovoltaic devices - Part 3: Measurement principles for terrestrial photovoltaic (PV) solar devices with reference spectral irradiance data
EN 60904-8:1998 Photovoltaic devices - Part 8: Measurement of spectral response of a photovoltaic (PV) device
EN 60904-9:2007 Photovoltaic devices - Part 9: Solar simulator performance requirements
EN 61215:2005 Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval
EN 61646:2008 Thin-film terrestrial photovoltaic (PV) modules - Design qualification and type approval