Verkkokauppa
SFS-EN IEC 60444-6:2021:en
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Soveltamisala
Suomenkielistä soveltamisalaa ei ole saatavissa.
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture).
Tämän julkaisun valmistelusta Suomessa vastaa SESKO ry, puh. 050 571 6048.
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture).
Tämän julkaisun valmistelusta Suomessa vastaa SESKO ry, puh. 050 571 6048.
Tuoteryhmä(t)
Sidokset
Velvoittavat viittaukset
EN 60444-5:1997 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
Tekninen komitea
Vahvistuspäivä
22.10.2021
Julkaisupäivä
26.10.2021
Painos
1
Sivumäärä
24
Julkaisun kieli
englanti