Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
Tämän julkaisun valmistelusta Suomessa vastaa Metalliteollisuuden Standardisointiyhdistys ry, puh. 09 19 231 (vaihde).
Sisällysluettelo
Foreword
Introduction
1 Scope
2 Normative references
3 Definitions
3.1 Profiles
3.3 Stylus instrument components
3.4 Metrological characteristics of the instrument
4 Nominal values for instrument characteristics
4.1 Stylus geometry
4.2 Static measuring force
4.3 Profile filter cut-off wavelength
4.4 Relationship between the roughness cut-off wavelength λc, tip radius and roughness cut-off ratio
Annex A Instruments conforming to ISO 3274:1975 (informative)
Annex В Background for the improvements introduced in this International Standard (informative)
Annex С Relation to the GPS matrix model (informative)