ISO 16826:2012 defines the principles for tandem- and longitudinal-longitudinal-transverse (LLT) wave-examination for the detection of discontinuities perpendicular to the surface. The general principles required for the ultrasonic examination of industrial products are described in ISO 16810. A list of symbols and equations is given in ISO 16811. The tandem- or LLT-examination should be used for the detection of planar discontinuities with distance to the surface greater than 15 mm. ISO 16826:2012 has been prepared for the examination of metallic materials with a thickness between 40 mm and 500 mm with parallel or concentric surfaces. It can, however, be used for other materials and smaller thickness provided special measures are taken.
Tämän julkaisun valmistelusta Suomessa vastaa Metalliteollisuuden Standardisointiyhdistys ry, puh. 09 19 231 (vaihde).
Sisällysluettelo
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Tandem examination
4.1 General
4.2 Time base adjustment
4.3 Setting of sensitivity
4.4 Determination of examination zones
4.5 DGS-diagram for tandem examination
4.6 Corrections of sensitivity
4.7 Object with concentric surfaces
5 LLT-examination
5.1 General
5.2 Time base adjustment and determination of discontinuity depth
5.3 Setting of sensitivity
5.4 Determination of examination depth
5.5 DGS-diagrams for LLT-examination
5.6 Correction of sensitivity
Annex A Nomograms for determination of tandem distances for convex (Figure A.1) and concave (Figure A.2) scanning surface (informative)
EN ISO 5577:2017 Non-destructive testing - Ultrasonic testing - Vocabulary (ISO 5577:2017)
ISO 16810:2012 Non-destructive testing -- Ultrasonic testing -- General principles
ISO 16811:2012 Non-destructive testing -- Ultrasonic testing -- Sensitivity and range setting
EN ISO 5577:2017 Non-destructive testing - Ultrasonic testing - Vocabulary (ISO 5577:2017)
ISO 16810:2012 Non-destructive testing -- Ultrasonic testing -- General principles
ISO 16811:2012 Non-destructive testing -- Ultrasonic testing -- Sensitivity and range setting
ISO 5577:2000 Non-destructive testing -- Ultrasonic inspection -- Vocabulary