Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.
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EN 61000-4-6:1996 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
EN 61000-4-6:1996 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
IEC 60050-161:1990 International Electrotechnical Vocabulary (IEV) - Part 161: Electromagnetic compatibility