Verkkokauppa
SFS-EN 62276:2016:en
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Soveltamisala
Suomenkielistä soveltamisalaa ei ole saatavissa.
IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.
Tämän julkaisun valmistelusta Suomessa vastaa SESKO ry, puh. 050 571 6048.
IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.
Tämän julkaisun valmistelusta Suomessa vastaa SESKO ry, puh. 050 571 6048.
Tuoteryhmä(t)
Sidokset
Velvoittavat viittaukset
EN 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
ISO 2859-1:1989 Sampling procedures for inspection by attributes -- Part 1: Sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection
ISO 2859-1:1989 Sampling procedures for inspection by attributes -- Part 1: Sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection
Tekninen komitea
Vahvistuspäivä
23.12.2016
Julkaisupäivä
27.12.2016
Painos
2
Sivumäärä
43
Julkaisun kieli
englanti