Verkkokauppa
SFS-EN 62884-2:2017:en
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
Soveltamisala
Suomenkielistä soveltamisalaa ei ole saatavissa.
IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
Tämän julkaisun valmistelusta Suomessa vastaa SESKO ry, puh. 050 571 6048.
IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
Tämän julkaisun valmistelusta Suomessa vastaa SESKO ry, puh. 050 571 6048.
Tuoteryhmä(t)
Sidokset
Velvoittavat viittaukset
Tekninen komitea
Vahvistuspäivä
15.12.2017
Julkaisupäivä
19.12.2017
Painos
1
Sivumäärä
28
Julkaisun kieli
englanti